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Verma, H. R.

Atomic and Nuclear Analytical Methods : XRF, Mössbauer, XPS, NAA and B63Ion-Beam Spectroscopic Techniques

Berlin, Heidelberg : Springer Berlin Heidelberg, 2007
Abstract/Sommario: 1. X-Ray Fluorescence (XRF) and Particle-Induced X-Ray Emission (PIXE) -- 2. Rutherford Backscattering Spectroscopy (RBS) -- 3. Elastic Recoil Detection (ERD) -- 4. Mössbauer Spectroscopy (MS) -- 5. X-Ray Photoelectron Spectroscopy (XPS) -- 6. Neutron Activation Analysis (NAA) -- 7. Nuclear Reaction Analysis (NRA) and Proton-Induced Gamma-Ray Emission (PIGE) -- 8. Accelerator Mass Spectrometry (AMS). - This book is a blend of analytical methods based on the phenomenon of atomic and nuc ...; [leggi tutto]
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Descrizione Atomic and Nuclear Analytical Methods : XRF, Mössbauer, XPS, NAA and B63Ion-Beam Spectroscopic Techniques / by H. R. Verma. - Berlin, Heidelberg : Springer Berlin Heidelberg, 2007. - XIV, 375 p. 128 illus ; digital
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Springer eBooks. - Printed edition: 9783540302773
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  • ISBN: 978-3-540-30279-7
  • DOI: 10.1007/978-3-540-30279-7
ID scheda 129036
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