Atomic and Nuclear Analytical Methods : XRF, Mössbauer, XPS, NAA and B63Ion-Beam Spectroscopic Techniques
Berlin, Heidelberg : Springer Berlin Heidelberg, 2007
Abstract/Sommario:
1. X-Ray Fluorescence (XRF) and Particle-Induced X-Ray Emission (PIXE) -- 2. Rutherford Backscattering Spectroscopy (RBS) -- 3. Elastic Recoil Detection (ERD) -- 4. Mössbauer Spectroscopy (MS) -- 5. X-Ray Photoelectron Spectroscopy (XPS) -- 6. Neutron Activation Analysis (NAA) -- 7. Nuclear Reaction Analysis (NRA) and Proton-Induced Gamma-Ray Emission (PIGE) -- 8. Accelerator Mass Spectrometry (AMS). - This book is a blend of analytical methods based on the phenomenon of atomic and nuc ...; [leggi tutto]
Campo | Valore |
---|---|
Descrizione | Atomic and Nuclear Analytical Methods : XRF, Mössbauer, XPS, NAA and B63Ion-Beam Spectroscopic Techniques / by H. R. Verma. - Berlin, Heidelberg : Springer Berlin Heidelberg, 2007. - XIV, 375 p. 128 illus ; digital |
Specifiche |
|
Note |
Springer eBooks. - Printed edition: 9783540302773
|
Autori |
|
Soggetto |
|
Lingua | |
Numeri |
|
ID scheda | 129036 |
Permalink | https://www.opac.inaf.it/?ids=129036 |